Simple, continuous and consistent physics based model for flicker noise in MOS transistors
Although there is still controversy about its origin, the designer requires accurate models to estimate 1/f noise of the MOS transistor in terms of its size, bias point and technology. Conventional models present limitations, they usually do not consistently represent the series-parallel association...
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| Formato: | article |
| Idioma: | inglês |
| Publicado em: |
2002
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| Acesso em linha: | https://hdl.handle.net/20.500.12008/21198 |
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