Characterization of MOS Transistor Current Mismatch

Electron device matching has been a key factor on the performance of today’s analog or even digital electronic circuits. This paper presents a study of drain current matching in MOS transistors. CMOS test structures were designed and fabricated as a way to develop an extensive experimental work, whe...

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Bibliographic Details

Main Author:	Klimach, H (author)
Other Authors:	Arnaud, Alfredo (author), Schneider, M. C (author), Galup Montoro, Carlos (author)
Format:	article
Language:	English
Published:	2004
Subjects:	MOSFET Analog design Matching Mismatch Compact models
Online Access:	https://hdl.handle.net/20.500.12008/21287
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