Characterization of MOS Transistor Current Mismatch
Electron device matching has been a key factor on the performance of today’s analog or even digital electronic circuits. This paper presents a study of drain current matching in MOS transistors. CMOS test structures were designed and fabricated as a way to develop an extensive experimental work, whe...
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| Auteur principal: | |
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| Autres auteurs: | , , |
| Format: | article |
| Langue: | anglais |
| Publié: |
2004
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| Sujets: | |
| Accès en ligne: | https://hdl.handle.net/20.500.12008/21287 |
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