Simple, continuous and consistent physics based model for flicker noise in MOS transistors

Although there is still controversy about its origin, the designer requires accurate models to estimate 1/f noise of the MOS transistor in terms of its size, bias point and technology. Conventional models present limitations, they usually do not consistently represent the series-parallel association...

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Bibliographic Details
Main Author: Arnaud, Alfredo (author)
Other Authors: Galup Montoro, Carlos (author)
Format: article
Language:English
Published: 2002
Subjects:
Online Access:https://hdl.handle.net/20.500.12008/21198
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