Predicting within-field soybean yield variability by coupling Sentinel-2 leaf area index with a crop growth model.

ABSTRACT: Accurate within-field yield estimation is an essential step to conduct yield gap analysis and steer crop management towards more efficient use of resources. This study aims to develop and validate a process-based soybean model and to predict within-field yield variability by coupling leaf...

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Bibliographic Details

Main Author:	GASO, D. (author)
Other Authors:	DE WIT, A. (author), BERGER, A. (author), KOOISTRA, L. (author)
Format:	article
Language:	English
Published:	2021
Subjects:	Yield prediction Crop growth model Sentinel-2 Data assimilation Soybean Soja
Online Access:	https://ainfo.inia.uy/consulta/busca?b=pc&id=62331&biblioteca=vazio&busca=62331&qFacets=62331
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