Dependability Evaluation of COTS Microprocessors via On-Chip debugging facilities

This paper presents a fault injection tool and methodology for performing Single-Event-Upsets (SEUs) injection campaigns on Commercial-off-the-shelf (COTS) microprocessors. This method takes advantage of the debug facilities of modern microprocessors along with standard GNU Debugger (GDB) for execut...

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Bibliographic Details

Main Author:	Isaza-González, José (author)
Other Authors:	Serrano-Cases, Alejandro (author), Restrepo-Calle, Felipe (author), Cuenca-Asensi, Sergio (author), Martínez-Álvarez, Antonio (author)
Format:	article
Language:	Spanish
Published:	2017
Subjects:	Commercial-off-the-shelf (COTS); on-chip debug; radiation effects; microprocessors reliability; fault injection; soft-error Commercial-off-the-shelf (COTS); depuración integrada en el chip; efectos de la radiación; fiabilidad de microprocesadores; inyección de fallos; errores lógicos
Online Access:	http://revistas.utp.ac.pa/index.php/id-tecnologico/article/view/1432 http://ridda2.utp.ac.pa/handle/123456789/1781
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