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Self-consistent dc, ac, noise and mismatch models of the mosfet

Trabajo presentado en NSTI Nanotechnology Conference and Trade Show, 2004

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Main Author: Galup Montoro, Carlos (author)
Other Authors: Schneider, M. C (author), Arnaud, Alfredo (author), Klimach, H (author)
Format: article
Language:English
Published: 2004
Subjects:
MOSFET
Analog design
Matching
Noise
Compact models
ELECTRÓNICA
Online Access:https://hdl.handle.net/20.500.12008/21283
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Summary:Trabajo presentado en NSTI Nanotechnology Conference and Trade Show, 2004

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