Optical characterization of thin semiconductor layers on arbitrary substrates
Various optical methods areof the most use for contactless investigation of thin semiconductor layers. Frequency dependencies of the refractive index real n' and imaginary n'' parts give an information about the main characteristics of the layer materials: energy gap width, junction density of state...
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| Main Author: | |
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| Other Authors: | , , , , , |
| Format: | article |
| Language: | English |
| Published: |
1994
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| Subjects: | |
| Online Access: | https://hdl.handle.net/20.500.12008/20894 |
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